"A built-in I_DDQ testing circuit."

Sotirios Matakias et al. (2005)

> Home

Details and statistics

DOI: 10.1109/ESSCIR.2005.1541662

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/esscirc/MatakiasTAHPM05
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/esscirc/MatakiasTAHPM05
Sotirios Matakias, Yiorgos Tsiatouhas, Angela Arapoyanni, Th. Haniotakis, Guillaume Prenat, Salvador Mir:
A built-in I_DDQ testing circuit. ESSCIRC 2005: 471-474

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.