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"Experimental evaluation of Physically Unclonable Functions in 65 nm CMOS."
Roel Maes et al. (2012)
- Roel Maes, Vladimir Rozic, Ingrid Verbauwhede, Patrick Koeberl, Erik van der Sluis, Vincent van der Leest:
Experimental evaluation of Physically Unclonable Functions in 65 nm CMOS. ESSCIRC 2012: 486-489
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