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"Variability analysis for sub-100 nm PD/SOI CMOS SRAM cell."

Rajiv V. Joshi et al. (2004)

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DOI: 10.1109/ESSCIR.2004.1356655

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-29

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  dblp key:
  - conf/esscirc/JoshiMPCCD04
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  - https://dblp.org/rec/conf/esscirc/JoshiMPCCD04
Rajiv V. Joshi, Saibal Mukhopadhyay, Donald W. Plass, Yuen H. Chan, Ching-Te Chuang, Anirudh Devgan:
Variability analysis for sub-100 nm PD/SOI CMOS SRAM cell. ESSCIRC 2004: 211-214

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