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"Circuit Monitoring Across Design Life-Cycle in 28nm FD-SOI and 40nm Bulk ..."

Sylvain Clerc et al. (2021)

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DOI: 10.1109/ESSCIRC53450.2021.9567890

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-28

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  dblp key:
  - conf/esscirc/ClercDWGMPDG21
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Sylvain Clerc, Kedar Janardan Dhori, Robin M. Wilson, Rohit Goel, Sébastien Marchal, Franck Pourchon, Christian Dutto, Ricardo Gomez Gomez:
Circuit Monitoring Across Design Life-Cycle in 28nm FD-SOI and 40nm Bulk CMOS technologies. ESSCIRC 2021: 271-274

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