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"Experimental assessment of logic circuit performance variability with ..."

Sungdae Choi et al. (2008)

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DOI: 10.1109/ESSCIRC.2008.4681789

access: closed

type: Conference or Workshop Paper

metadata version: 2020-09-25

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  dblp key:
  - conf/esscirc/ChoiIKIMNTS08
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  - https://dblp.org/rec/conf/esscirc/ChoiIKIMNTS08
Sungdae Choi, Katsuyuki Ikeuchi, Hyunkyung Kim, Kenichi Inagaki, Masami Murakata, Nobuyuki Nishiguchi, Makoto Takamiya, Takayasu Sakurai:
Experimental assessment of logic circuit performance variability with regular fabrics at 90nm technology node. ESSCIRC 2008: 50-53

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