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"Relation between internal terminal voltage and immunity behavior of LDO ..."

Hidetoshi Miyahara et al. (2015)

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DOI: 10.1109/EMCCOMPO.2015.7358346

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-02

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  - conf/emccompo/MiyaharaIMHW15
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Hidetoshi Miyahara, Nobuaki Ikehara, Tohlu Matsushima, Takashi Hisakado, Osami Wada:
Relation between internal terminal voltage and immunity behavior of LDO regulator circuits. EMC Compo 2015: 143-146

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