Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Characterization and modeling of electrical stresses on digital integrated ..."

Alexandre Boyer, Sonia Ben Dhia (2013)

> Home

Details and statistics

DOI: 10.1109/EMCCOMPO.2013.6735199

access: closed

type: Conference or Workshop Paper

metadata version: 2019-06-12

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/emccompo/BoyerD13
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/emccompo/BoyerD13
Alexandre Boyer, Sonia Ben Dhia:
Characterization and modeling of electrical stresses on digital integrated circuits power integrity and conducted emission. EMC Compo 2013: 190-195

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.