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"Atomic Force Microscope Characterization of the Bending Stiffness and ..."

Ti'Air E. Riggins, Wen Li, Erin K. Purcell (2022)

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DOI: 10.1109/EMBC48229.2022.9871216

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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Ti'Air E. Riggins, Wen Li, Erin K. Purcell:
Atomic Force Microscope Characterization of the Bending Stiffness and Surface Topography of Silicon and Polymeric Electrodes. EMBC 2022: 2348-2352

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