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"Extract-and-match geometric corner and step pattern approach for ..."

Jimmy Addison Lee et al. (2017)

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DOI: 10.1109/EMBC.2017.8036888

access: closed

type: Conference or Workshop Paper

metadata version: 2022-04-09

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Jimmy Addison Lee, Mengdi Xu, Jun Cheng, Huazhu Fu, Damon Wing Kee Wong, Nicolas Foin:
Extract-and-match geometric corner and step pattern approach for registration of fluoroscopic X-ray sequences. EMBC 2017: 568-571

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