"Fault Diagnosis of Indium Tin Oxide Electrodes by Multi-channel ..."

Sungho Suh, Haebom Lee, Tae Yeob Kang (2024)

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DOI: 10.1109/ICEIC61013.2024.10457097

access: closed

type: Conference or Workshop Paper

metadata version: 2024-04-02

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Sungho Suh, Haebom Lee, Tae Yeob Kang:
Fault Diagnosis of Indium Tin Oxide Electrodes by Multi-channel S-parameter Patterns. ICEIC 2024: 1-4

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