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"Electrical Parameters Degradation of E-mode GaN Under Repeated ..."

Lei Sun et al. (2020)

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DOI: 10.1145/3443467.3443892

access: closed

type: Conference or Workshop Paper

metadata version: 2023-08-04

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Lei Sun, Dongqing Hu, Xintian Zhou, Meng Liu, Jie Cao:
Electrical Parameters Degradation of E-mode GaN Under Repeated Short-Circuit Impacts. EITCE 2020: 986-990

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