Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Study on The Degradations Produced by Different P-base Diffusion ..."

Xinyu Li et al. (2021)

> Home

Details and statistics

DOI: 10.1145/3501409.3501451

access: closed

type: Conference or Workshop Paper

metadata version: 2023-08-04

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/eitce/LiJZZFD21
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/eitce/LiJZZFD21
Xinyu Li, Yunpeng Jia, Xintian Zhou, Yuanfu Zhao, Xingyu Fang, Zhonghan Deng:
Study on The Degradations Produced by Different P-base Diffusion Temperatures on SGT MOSFET With Approximate Threshold Voltage. EITCE 2021: 226-231

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.