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"AI-Based Localization and Classification of Visual Anomalies on ..."

Minh Khai Le, Jason Zi Jie Chia, Dennis Peskes (2023)

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DOI: 10.1109/EIT57321.2023.10187356

access: closed

type: Conference or Workshop Paper

metadata version: 2023-08-08

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Minh Khai Le, Jason Zi Jie Chia, Dennis Peskes:
AI-Based Localization and Classification of Visual Anomalies on Semiconductor Devices. eIT 2023: 122-126

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