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"High sensitivity analysis of speckle patterns: a technological challenge ..."

Jean-Michel Tualle et al. (2013)

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DOI: 10.1117/12.2006382

access: closed

type: Conference or Workshop Paper

metadata version: 2023-08-02

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  - conf/ei-iss/TualleBTE13
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Jean-Michel Tualle, Kinia Barjean, Eric Tinet, Dominique Ettori:
High sensitivity analysis of speckle patterns: a technological challenge for biomedical optics. Sensors, Cameras, and Systems for Industrial and Scientific Applications 2013: 86590K

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