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"Tire defect detection with limited annotation."

Chih-Hui Ho et al. (2023)

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DOI: 10.2352/EI.2023.35.5.IRIACV-321

access: open

type: Conference or Workshop Paper

metadata version: 2023-07-21

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  dblp key:
  - conf/ei-iriacv/HoHKBV23
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  - https://dblp.org/rec/conf/ei-iriacv/HoHKBV23
Chih-Hui Ho, Ziheng Huang, Nayeon Kim, You-Suk Bae, Nuno Vasconcelos:
Tire defect detection with limited annotation. IRIACV 2023: 1-6

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