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"Measurement Method for the Dynamic On-State Resistance of GaN Semiconductors."

Michal Sír, Ivan Feno (2018)

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DOI: 10.1109/EECS.2018.00106

access: closed

type: Conference or Workshop Paper

metadata version: 2020-10-25

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  dblp key:
  - conf/eecs/SirF18
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Michal Sír, Ivan Feno:
Measurement Method for the Dynamic On-State Resistance of GaN Semiconductors. EECS 2018: 543-546

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