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"A Compact Monitoring Circuit to Accurately Extract Fabrication Deviation ..."
Tsuyoshi Horikawa et al. (2020)
- Tsuyoshi Horikawa, Hideaki Okayama, Yosuke Onawa, Daisuke Shimura, Jun Ushida
, Akemi Shiina, Tadashi Murao, Hiroki Yaegashi:
A Compact Monitoring Circuit to Accurately Extract Fabrication Deviation in Silicon Waveguides. ECOC 2020: 1-4
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