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"Experimental Demonstration of Automatic Reconfiguration and Failure ..."

Guangwei Cong et al. (2021)

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DOI: 10.1109/ECOC52684.2021.9606111

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-26

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Guangwei Cong, Noritsugu Yamamoto, Yuriko Maegami, Morifumi Ohno, Koji Yamada:
Experimental Demonstration of Automatic Reconfiguration and Failure Recovery of Silicon Photonic Circuits. ECOC 2021: 1-4

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