"Deep Learning for Multi-path Error Removal in ToF Sensors."

Gianluca Agresti, Pietro Zanuttigh (2018)

Details and statistics

DOI: 10.1007/978-3-030-11015-4_30

access: closed

type: Conference or Workshop Paper

metadata version: 2019-10-19

a service of  Schloss Dagstuhl - Leibniz Center for Informatics