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"A fully automated large-scale addressable test chip design with high ..."

Bo Zhang et al. (2011)

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DOI: 10.1109/ECCTD.2011.6043609

access: closed

type: Conference or Workshop Paper

metadata version: 2023-07-28

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Bo Zhang, Weiwei Pan, Yongjun Zheng, Zheng Shi, Xiaolang Yan:
A fully automated large-scale addressable test chip design with high reliability. ECCTD 2011: 61-64

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