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"Application of functional IDDQ testing in a VLIW processor towards ..."

Yong Zhao, Hans G. Kerkhoff (2015)

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DOI: 10.1109/DTIS.2015.7127359

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-22

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Yong Zhao, Hans G. Kerkhoff:
Application of functional IDDQ testing in a VLIW processor towards detection of aging degradation. DTIS 2015: 1-5

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