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"STT-MRAM cell reliability evaluation under process, voltage and ..."
Elena I. Vatajelu et al. (2015)
- Elena I. Vatajelu, Rosa Rodríguez-Montañés, Marco Indaco, Paolo Prinetto, Joan Figueras:
STT-MRAM cell reliability evaluation under process, voltage and temperature (PVT) variations. DTIS 2015: 1-6
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