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"Entropy source characterization in HfO2 RRAM for TRNG applications."

Florian Pebay-Peyroula, Thomas Dalgaty, Elisa Vianello (2020)

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DOI: 10.1109/DTIS48698.2020.9081294

access: closed

type: Conference or Workshop Paper

metadata version: 2020-05-11

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  dblp key:
  - conf/dtis/Pebay-PeyroulaD20
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  - https://dblp.org/rec/conf/dtis/Pebay-PeyroulaD20
Florian Pebay-Peyroula, Thomas Dalgaty, Elisa Vianello:
Entropy source characterization in HfO2 RRAM for TRNG applications. DTIS 2020: 1-2

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