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"Analog circuits testing using digitally coded indirect measurements."

Álvaro Gómez-Pau, Luz Balado, Joan Figueras (2015)

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DOI: 10.1109/DTIS.2015.7127357

access: closed

type: Conference or Workshop Paper

metadata version: 2020-04-16

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  dblp key:
  - conf/dtis/Gomez-PauBF15
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  - https://dblp.org/rec/conf/dtis/Gomez-PauBF15
Álvaro Gómez-Pau, Luz Balado, Joan Figueras:
Analog circuits testing using digitally coded indirect measurements. DTIS 2015: 1-6

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