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"Characterizing Application Memory Error Vulnerability to Optimize ..."
Yixin Luo et al. (2014)
- Yixin Luo, Sriram Govindan, Bikash Sharma, Mark Santaniello, Justin Meza, Aman Kansal, Jie Liu, Badriddine Khessib, Kushagra Vaid, Onur Mutlu:
Characterizing Application Memory Error Vulnerability to Optimize Datacenter Cost via Heterogeneous-Reliability Memory. DSN 2014: 467-478
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