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"Surface Defects Detection by Clustering and Rotating Image Analysis."
Roman Melnyk, Ruslan Tushnytskyy, Yurii Havrylko (2020)
- Roman Melnyk, Ruslan Tushnytskyy, Yurii Havrylko:
Surface Defects Detection by Clustering and Rotating Image Analysis. DSMP 2020: 206-210
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