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"Fault Diagnosis in Integrated Circuits with BIST."

Raimund Ubar et al. (2007)

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DOI: 10.1109/DSD.2007.4341530

access: closed

type: Conference or Workshop Paper

metadata version: 2020-10-25

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  dblp key:
  - conf/dsd/UbarKREL07
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  - https://dblp.org/rec/conf/dsd/UbarKREL07
Raimund Ubar, Sergei Kostin, Jaan Raik, Teet Evartson, Harri Lensen:
Fault Diagnosis in Integrated Circuits with BIST. DSD 2007: 604-610

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