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"Implementation-Independent Functional Test for Transition Delay Faults in ..."

Adeboye Stephen Oyeniran et al. (2020)

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DOI: 10.1109/DSD51259.2020.00105

access: closed

type: Conference or Workshop Paper

metadata version: 2020-10-14

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  - conf/dsd/OyeniranUJR20
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Adeboye Stephen Oyeniran, Raimund Ubar, Maksim Jenihhin, Jaan Raik:
Implementation-Independent Functional Test for Transition Delay Faults in Microprocessors. DSD 2020: 646-650

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