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"Exploiting Bus Level and Bit Level Inactivity for Preventing Wire ..."
Mehmet Kayaalp, Fahrettin Koc, Oguz Ergin (2012)
- Mehmet Kayaalp, Fahrettin Koc, Oguz Ergin:
Exploiting Bus Level and Bit Level Inactivity for Preventing Wire Degradation due to Electromigration. DSD 2012: 280-287
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