"Exploiting Bus Level and Bit Level Inactivity for Preventing Wire ..."

Mehmet Kayaalp, Fahrettin Koc, Oguz Ergin (2012)

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DOI: 10.1109/DSD.2012.56

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Mehmet Kayaalp, Fahrettin Koc, Oguz Ergin:
Exploiting Bus Level and Bit Level Inactivity for Preventing Wire Degradation due to Electromigration. DSD 2012: 280-287

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