Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Analyzing and Increasing Yield of ZnO Thin-Film Transistors for Large-area ..."

Zhiwu Zheng et al. (2019)

> Home

Details and statistics

DOI: 10.1109/DRC46940.2019.9046406

access: closed

type: Conference or Workshop Paper

metadata version: 2022-06-23

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/drc/ZhengAMWVS19
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/drc/ZhengAMWVS19
Zhiwu Zheng, Levent E. Aygun, Yoni Mehlman, Sigurd Wagner, Naveen Verma, James C. Sturm:
Analyzing and Increasing Yield of ZnO Thin-Film Transistors for Large-area Sensing Systems by Preventing Process-Induced Gate Dielectric Breakdown. DRC 2019: 141-142

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.