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"Technology scaling effects on SRAM-PUF reliability under ionizing radiation."

Umeshwarnath Surendranathan, Horace Wilson, Biswajit Ray (2023)

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DOI: 10.1109/DRC58590.2023.10187098

access: closed

type: Conference or Workshop Paper

metadata version: 2023-08-08

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  - conf/drc/SurendranathanWR23
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Umeshwarnath Surendranathan, Horace Wilson, Biswajit Ray:
Technology scaling effects on SRAM-PUF reliability under ionizing radiation. DRC 2023: 1-2

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