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"Barrier Height Stability and Reverse Leakage Mechanisms in Ni/Ga2O3 (001) ..."

Wenshen Li et al. (2019)

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DOI: 10.1109/DRC46940.2019.9046433

access: closed

type: Conference or Workshop Paper

metadata version: 2020-04-03

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  dblp key:
  - conf/drc/LiNHJX19
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  - https://dblp.org/rec/conf/drc/LiNHJX19
Wenshen Li, Kazuki Nornoto, Zongyang Hu, Debdeep Jena, Huili Grace Xing:
Barrier Height Stability and Reverse Leakage Mechanisms in Ni/Ga2O3 (001) Schottky Barrier Diodes. DRC 2019: 159-160

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