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"Bias Stress Stability of ITO Transistors and its Dependence on Dielectric ..."
Lauren Hoang et al. (2022)
- Lauren Hoang, Alwin Daus
, Sumaiya Wahid, Jimin Kwon, Jung-Soo Ko, Shengjun Qin, Mahnaz Islam, Krishna C. Saraswat, H.-S. Philip Wong, Eric Pop
:
Bias Stress Stability of ITO Transistors and its Dependence on Dielectric Properties. DRC 2022: 1-2
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