"Statistical identification and analysis of defect development in digital ..."

Jenny Leung et al. (2009)

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DOI: 10.1117/12.806109

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-21

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Jenny Leung, Glenn H. Chapman, Zahava Koren, Israel Koren:
Statistical identification and analysis of defect development in digital imagers. Digital Photography 2009: 72500

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