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"Analyzing and improving delay defect tolerance in pipelined combinational ..."

David Wessels, Jon C. Muzio (1995)

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DOI: 10.1109/DFTVS.1995.476951

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/dft/WesselsM95
David Wessels, Jon C. Muzio:
Analyzing and improving delay defect tolerance in pipelined combinational circuits. DFT 1995: 181-188

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