"Effective Post-BIST Fault Diagnosis for Multiple Faults."

Hiroshi Takahashi et al. (2006)

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DOI: 10.1109/DFT.2006.24

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/dft/TakahashiKHTYAS06
Hiroshi Takahashi, Shuhei Kadoyama, Yoshinobu Higami, Yuzo Takamatsu, Koji Yamazaki, Takashi Aikyo, Yasuo Sato:
Effective Post-BIST Fault Diagnosis for Multiple Faults. DFT 2006: 401-109

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