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"Defect Characterization and Tolerance of QCA Sequential Devices and Circuits."

Mariam Momenzadeh, Jing Huang, Fabrizio Lombardi (2005)

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DOI: 10.1109/DFTVS.2005.26

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/dft/MomenzadehHL05
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  persistent URL:
  - https://dblp.org/rec/conf/dft/MomenzadehHL05
Mariam Momenzadeh, Jing Huang, Fabrizio Lombardi:
Defect Characterization and Tolerance of QCA Sequential Devices and Circuits. DFT 2005: 199-207

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