"NBTI Monitoring and Design for Reliability in Nanoscale Circuits."

Seyab Khan et al. (2011)

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DOI: 10.1109/DFT.2011.49

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Seyab Khan, Nor Zaidi Haron, Said Hamdioui, Francky Catthoor:
NBTI Monitoring and Design for Reliability in Nanoscale Circuits. DFT 2011: 68-76

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