"Defect Characterization for Scaling of QCA Devices."

Jing Huang et al. (2004)

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DOI: 10.1109/DFT.2004.24

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type: Conference or Workshop Paper

metadata version: 2023-03-24

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Jing Huang, Mariam Momenzadeh, Mehdi Baradaran Tahoori, Fabrizio Lombardi:
Defect Characterization for Scaling of QCA Devices. DFT 2004: 30-38

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