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"Test Time Reduction in a Manufacturing Environment by Combining BIST and ATE."

Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi (2002)

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DOI: 10.1109/DFTVS.2002.1173515

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - conf/dft/HashempourML02
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  - https://dblp.org/rec/conf/dft/HashempourML02
Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi:
Test Time Reduction in a Manufacturing Environment by Combining BIST and ATE. DFT 2002: 186-194

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