"A cross-layer fault-tolerant design method for high manufacturing yield ..."

Jianghao Guo et al. (2013)

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DOI: 10.1109/DFT.2013.6653585

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/dft/GuoHJW13
Jianghao Guo, Qiang Han, Wen-Ben Jone, Yu-Liang Wu:
A cross-layer fault-tolerant design method for high manufacturing yield and system reliability. DFTS 2013: 71-76

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