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"Analysis and Evaluation of the Effects of Single Event Upsets (SEU s) on ..."

Zhen Gao et al. (2021)

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DOI: 10.1109/DFT52944.2021.9568336

access: closed

type: Conference or Workshop Paper

metadata version: 2022-07-21

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  dblp key:
  - conf/dft/GaoWDR21
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Zhen Gao, Ruize Wang, Haoyu Du, Pedro Reviriego:
Analysis and Evaluation of the Effects of Single Event Upsets (SEU s) on Memories in Polar Decoders. DFT 2021: 1-6

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