"Test Generation for Stuck-at and Gate-Delay Faults in Sequential Circuits: ..."

Franco Fummi, Donatella Sciuto, Micaela Serra (1994)

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type: Conference or Workshop Paper

metadata version: 2003-01-24

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Franco Fummi, Donatella Sciuto, Micaela Serra:
Test Generation for Stuck-at and Gate-Delay Faults in Sequential Circuits: A Mixed Functional/Structural Method. DFT 1994: 254-262

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