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"Low-Speed Scan Testing of Charge-Sharing Faults for CMOS Domino Circuits."

Ching-Hwa Cheng et al. (2000)

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DOI: 10.1109/DFTVS.2000.887173

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  persistent URL:
  - https://dblp.org/rec/conf/dft/ChengWCJ00
Ching-Hwa Cheng, Jinn-Shyan Wang, Shih-Chieh Chang, Wen-Ben Jone:
Low-Speed Scan Testing of Charge-Sharing Faults for CMOS Domino Circuits. DFT 2000: 329-337

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