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"Exploring soft errors (SEUs) with digital imager pixels ranging from 7 to ..."

Glenn H. Chapman et al. (2017)

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DOI: 10.1109/DFT.2017.8244457

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/dft/ChapmanPLKK17
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  persistent URL:
  - https://dblp.org/rec/conf/dft/ChapmanPLKK17
Glenn H. Chapman, Parham Purbakht, Peter Le, Israel Koren, Zahava Koren:
Exploring soft errors (SEUs) with digital imager pixels ranging from 7 to 1.3 μm. DFT 2017: 1-4

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