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"Observability Driven Path Generation for Delay Test Coverage Improvement ..."

Avijit Chakraborty, D. M. H. Walker (2020)

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DOI: 10.1109/DFT50435.2020.9250797

access: closed

type: Conference or Workshop Paper

metadata version: 2020-11-17

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Avijit Chakraborty, D. M. H. Walker:
Observability Driven Path Generation for Delay Test Coverage Improvement in Scan Limited Circuits. DFT 2020: 1-4

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