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"AFFCCA: a tool for critical area analysis with circular defects and ..."
Igor Bubel et al. (1995)
- Igor Bubel, Wojciech Maly, Thomas Waas, Pranab K. Nag, Hans Hartmann, Doris Schmitt-Landsiedel, Susanne Griep:
AFFCCA: a tool for critical area analysis with circular defects and lithography deformed layout. DFT 1995: 10-18
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