"A Parametric Design of a Built-in Self-Test FIFO Embedded Memory."

Stefano Barbagallo et al. (1996)

Details and statistics

DOI: 10.1109/DFTVS.1996.572028

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

a service of  Schloss Dagstuhl - Leibniz Center for Informatics