"Counterfeit Chip Detection using Scattering Parameter Analysis."

Maryam Saadat-Safa, Tahoura Mosavirik, Shahin Tajik (2023)

Details and statistics

DOI: 10.1109/DDECS57882.2023.10139623

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-26

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