"Radiation- and Temperature-Induced Fault Modeling and Simulation in BiCMOS ..."

Konstantin O. Petrosyants, Maxim V. Kozhukhov, Dmitry Popov (2019)

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DOI: 10.1109/DDECS.2019.8724651

access: closed

type: Conference or Workshop Paper

metadata version: 2025-11-15

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Konstantin O. Petrosyants, Maxim V. Kozhukhov, Dmitry Popov:
Radiation- and Temperature-Induced Fault Modeling and Simulation in BiCMOS LSI's Components using RAD-THERM TCAD Subsystem. DDECS 2019: 1-4

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